Hardware

The uncorrected FEI TitanX 60-300 microscope at NCEM is equipped to do fast energy dispersive X-ray mapping (EDS), 4D-STEM, S/ TEM imaging and tomography. All TEM holders that are compatible with FEI microscopes can be used for heating, cooling and other in-situ experiments. The ability to switch between 60, 80, 120, 200, and 300kV during one TEM session gives the user flexibility to optimize experimental conditions – balancing sample damage, spatial resolution, and signal-to-noise.

https://foundry.lbl.gov/instrumentation/titanx/

Computers

Microscope PC

Windows 7

Camera PC

Windows 10

Software

Crucible Login

Processing and Analysis

DM4 files in Crucible

DM4 STEM datasets are automatically ingested into Crucible and can be viewed on SciCat or accessed via Google Drive.